报告题目：Design of RRAM System to Address the Reliability and Radiation Soft-Errors in the Memory Applications

报告人：Professor Wei Lan（魏蓝） 加拿大滑铁卢大学

报告时间：2017年11月24日（星期五）上午 10:00

报告地点：独墅湖校区701-B501室

报告摘要：With the continuous and aggressive technology scaling, the design of memory systems becomes very challenging. From the application side, the desire to have high-capacity, reliable, and energy efficient memory arrays is rising rapidly. From the technology side, the increasing leakage power and the restrictions resulting from the manufacturing limitations complicate the design of the memory systems. Hence, the need to incorporate the emerging scalable non-volatile memory devices in the various systems has increased in recent years.

The Resistive Random Access Memory (RRAM) device has many advantages including its low-programming requirements, its large ratio between its high resistive state and low resistive state, and its compatibility with the Complementary Metal Oxide Semiconductor (CMOS) fabrication process.However, the RRAM device suffers from reliability and radiation soft-errors which can alter the data saved on it.

In this talk, we apply the RRAM to conventional and non-conventional storage systems including those used in advanced neuromorphic designs. In particular, we focus on providing various solutions for RRAM soft-errors (reliability and radiation effects) in those systems. Each proposed design is simulated to demonstrate the capability of detecting, fixing, and minimizing the chances of re-occurrence of RRAM soft-errors. In addition, the proposed design are carefully considered to ensure minimum impact on the increase of energy consumption and delay of the read and write operations of the various systems.

报告人简介：Prof. Lan Wei received her B. S. in Microelectronics and Economics from Peking University, Beijing, China in 2005 and M. S. and Ph. D. in Electrical Engineering from Stanford University, Stanford, USA (with Prof. H. –S. Philip Wong) in 2007 and 2010, respectively.

Before joining UWaterloo in 2014, Lan worked at Altera Corporation (now part of Intel Corporation) in San Jose, California, where her responsibilities included foundry technology evaluation, power management and Stratix X FPGA product development with Intel 14nm technology. Lan also worked as a post-doctoral associate in Microsystems Technology Laboratories, Massachusetts Institute of Technology under Prof. Dimitri Antoniadis.

Lan's research focuses on device-circuit interactive design and optimization, integrated nanoelectronic systems with imperfect technologies (e.g. low-dimensional materials based transistors and non-volatile memories with imperfect materials, process and reliability failures), GaN-based technology for millimetre wave communication, and self-powered grid sensing and monitoring systems.

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